We will assist with migration tests and insulation degradation tests.
This product is a program for Windows computers designed to help customers build a migration testing system using commercially available measuring instruments. Generally, "migration testing devices" are expensive, and many customers may hesitate to adopt them despite recognizing their necessity. If customers can prepare the commercially available measuring instruments specified by this program, an affordable migration testing system can be completed. Additionally, the measuring instrument used is the Advantest R8340, which is commonly used in Japan, so many customers may already own it. The connection between the computer and the measuring instrument uses the standard interface GP-IB, making it easy even for first-time users. There are already numerous operational records in various laboratories, and combined with the use of commercially available measuring instruments, you can use it with confidence.
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basic information
【Features】 ■ Migration tests and insulation degradation tests can be conducted with up to 80 channels (or 20 channels). ■ It operates as an add-in program on Excel, with measurement values directly entered into the Excel sheet. ■ Maximum applied voltage/maximum measurement voltage of 200V, maximum current of 300mA. ■ Measurement range and accuracy are based on the use of the 8340A main unit. ■ Sequence measurements for charge/measure/discharge can be performed. ■ Measurement time intervals can be freely set from a few seconds to 36,000 hours. ■ Up to 200,000 measurement values can be imported into the Excel sheet. ■ If a multimeter with temperature measurement capability is connected, simultaneous measurement of the surrounding temperature is also possible. . ◎ For more detailed information, please refer to the catalog or contact us directly.
Price information
320,000 yen to 760,000 yen Please feel free to contact us.
Price range
P4
Delivery Time
P1
Applications/Examples of results
<Lineup> ■ 200V (20ch/80ch) Migration Test Program - Price: 320,000 yen / 680,000 yen ■ 1000V (80ch) Migration Test Program - Price: 680,000 yen ■ Semiconductor Parameter Measurement Migration Test - Price: 340,000 yen / 760,000 yen * A detailed catalog is available. Please request it.
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Company information
We are proposing the construction of an automatic measurement system using commercially available measuring instruments and developing software for it.