Semiconductor Test Architects
Semiconductor Parametric Test, Reliability Test, Multi-Site/Die Test
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basic information
STAr's Virgo series of high performance parametric probe cards enable low-level leakage current and capacitance testing with consistent results and high accuracies under extreme thermal conditions on small pads used in nanometer technologies.
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Applications/Examples of results
Semiconductor Parametric Test, Reliability Test, Multi-Site/Die Test
Company information
Star Technologies Co., Ltd. is a channel/solution partner of Agilent Technologies, providing semiconductor testing systems, software for the semiconductor industry, and professional services. Star Technologies was established in 2000, is headquartered in Hsinchu City, Taiwan, and has subsidiaries in the United States, Japan, South Korea, China, India, and Singapore.