Ideal for drop impact tests! It monitors the moment of mechanical stress!
- A system that can monitor the moment when the electrical resistance in the conduction path of electronic components increases or becomes open (OPNE) due to mechanical stress occurring at regular intervals, such as during drop impact tests. - Based on trigger information from impact signals (such as acceleration), resistance value data is collected for a fixed period before and after the trigger for 10 msec at intervals of 1 μsec (10,000 points). - By comparing with management standards, if the peak resistance value of each channel exceeds the management value, an event signal can be generated. - The stored information can be re-read using the Viewer function, regardless of whether it is during or after data collection. Additionally, results such as peak resistance values can be extracted as text data.
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basic information
【Features】 ○ Resistance values (up to 16 channels) ○ MaxG, MinG, acceleration waveform width (pulse width) ⇒ Analyze and read the data saved in the acceleration waveform management application for integrated management. ○ Statistical information for each item ○ Continuously save data for each item per cycle and resistance waveform data for all channels. ○ Continuation of tests using existing data is also possible. ● For more details, please download the catalog.
Price information
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Delivery Time
Applications/Examples of results
【Example of Achievements】 ○ Acceleration-related information management application ⇒ Integrating acceleration-related parameters in the continuity OPEN check system.
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Company information
As a development and design company, we promote the development, design, and evaluation of semiconductor peripheral circuits and application products through simulation technology.