Inspection data files and defect image files can be displayed using judgment or macro MAP.
It is a high-speed automatic inspection machine for sapphire wafer defects and foreign material defects. It uses a double cassette system to load, inspect, and unload at a cycle time of 30 seconds per wafer. For more details, please download and view the catalog.
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basic information
【Features】 1. Inspection data files and defect image files can be displayed using judgment or macro MAP. 2. Equipped with vibration prevention mechanisms, safety covers, FFU, and cleanroom compatibility. 3. Designed exclusively for 2-inch, supporting a structure that allows cassette-to-cassette return for 25 sheets. ◎ You can view detailed specifications and more by downloading the catalog. If you are interested, please download and check the catalog.
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We will collaboratively think about and manufacture prototypes, automatic machines, and online machines for inspection equipment that supports the manufacturing and development of new technologies, tailored to your ideas and requests. We provide everything from the design and manufacturing maintenance of hardware, optical systems, and software for ordered products to after-sales service.