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last updated:Feb 20, 2014

S&T出版
S&T出版
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A clear explanation of surface analysis for developers and manufacturers who are not specialists in analysis!

○Publication Date: December 10, 2007 ○Format: B5 size, paperback, 618 pages ○Price: 33,000 yen (excluding tax) → STbook member price: 31,350 yen (excluding tax) First Edition: December 2007 This book is a revised edition of "Surface and Depth Analysis Methods," published in December 2007 (ISBN 978-4-903413-30-3), with updated binding and pricing. The content is the same as the 2007 publication, so please be careful not to make a mistake when purchasing. ○Authors: Hiroyoshi Soejima, Shimadzu Scientific Research Institute, Inc. / Takeshi Teratani, Sumika Chemical Analysis Service, Ltd. / Junichiro Murayama, Sumitomo Metal Technology, Ltd. / Shinji Nagamachi, Ion Engineering Research Institute, Inc. / Keizo Ishii, Tohoku University / Kazutoshi Kakita, Nippon Steel Technoresearch, Inc. / Makoto Nishino, Shimadzu Corporation / Makishi Ishikawa, Cameca Instruments, Inc. / Takahiro Hoshi, ULVAC, Inc. / Satoshi Kawata, SII Nanotechnology, Inc. / Satoshi Yoshimi, Shimadzu Comprehensive Analysis Testing Center / and 45 others.

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Book Surface and Depth Analysis Methods [New Edition]

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Chapter 1: How to Choose Surface Analysis Chapter 2: Various Analysis Methods Section 1: Auger Electron Spectroscopy (AES) Section 2: Electron Probe Microanalysis (EPMA) Section 3: Rutherford Backscattering Spectrometry (RBS) Section 4: Particle-Induced X-ray Emission (PIXE) Section 5: Glow Discharge Spectroscopy (GDS) Section 6: X-ray Fluorescence Spectroscopy (XRF) Section 7: Secondary Ion Mass Spectrometry (SIMS) Section 8: Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) Section 9: Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) Section 10: Scanning Electron Microscopy (SEM) Section 11: Transmission Electron Microscopy (TEM) Section 12: Atomic Force Microscopy (AFM) Section 13: X-ray Diffraction (XRD) Section 14: X-ray Photoelectron Spectroscopy (ESCA XPS) Section 15: Fourier Transform Infrared Spectroscopy (FT-IR) Section 16: Raman Spectroscopy Chapter 3: Analysis Methods by Sample Chapter 4: Analysis Methods by Purpose

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Main body 33,000 yen + tax → STbook member price: 31,350 yen + tax

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Book Surface and Depth Direction Analysis Methods [New Edition]

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