Evaluation of composition, bonding state, structure, and density is possible.
In the pursuit of improving the efficiency of CIGS thin-film solar cells, various buffer layer materials have been investigated for controlling the band structure and crystallinity from the light absorption layer to the transparent electrode. This presents a case study of various evaluations conducted using X-rays on Zn-based buffer layers deposited on a flattened substrate. Comparisons can be made between different levels based on deposition conditions and various processes after deposition.
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For detailed data, please refer to the catalog.
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Analysis of solar cells and oxide semiconductors.
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!