EBSD: Electron Backscatter Diffraction
By conducting EBSD analysis on thinned samples, higher spatial resolution can be achieved compared to conventional bulk samples.
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basic information
For detailed data, please refer to the catalog.
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Applications/Examples of results
Analysis of LSI, memory, and electronic components.
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Company information
MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
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