XRD: X-ray diffraction method
When measurements are conducted using a two-dimensional detector, information about the diffraction angle (2θ) as well as the tilt direction (χ) can be obtained simultaneously. The observed two-dimensional diffraction pattern can visualize characteristics such as the crystallinity and orientation of the material, making it effective for evaluating materials where orientation affects their properties.
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Applications/Examples of results
Analysis of oxide semiconductors, LSI, and memory.
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!