Significantly improve work efficiency!
The "AMC-7800" is a breaking device designed to create cross-sectional samples for SEM observation of materials such as mask glass, silicon, SiC, liquid crystal substrates, and sapphire substrates. The operation is simple, requiring only five steps, and allows for the production of observation samples with beautiful fracture surfaces in a short amount of time. Additionally, it significantly improves work efficiency. 【Features】 ■ No polishing ■ Completely dry cutting ■ High-precision scribing mechanism ■ Skip scribing mechanism ■ Low running costs *For more details, please refer to the catalog or feel free to contact us.
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【Specifications】 ■Marking Accuracy: ±15.0μm ■Optical System: Monocular Zoom Stereo Microscope ■Imaging System: CCD Camera + 15-inch LCD ■Magnification: Approximately 22x to Approximately 140x ■Body Size: 445W × 535D × 650H (mm) ■Body Weight: Approximately 50kg *For more details, please refer to the catalog or feel free to contact us.
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For more details, please refer to the catalog or feel free to contact us.
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