"Inspection probes compatible with ultra-fine pitch" Automatic production system from microfabrication to inspection.
The "MEMS Probe" is an ideal MEMS probe for semiconductor wafer testing, including microprocessors and application processors. This product achieves low resistance and low inductance through its unique structure. Additionally, our company manufactures probes with high precision and stable quality, handling everything from the processing of fine MEMS spring probes to inspection, so please feel free to contact us. 【Features】 ■ Unique structure ■ Optimal for semiconductor wafer testing ■ Supports ultra-fine pitch ■ Achieves low resistance and low inductance *For more details, please refer to the catalog or feel free to contact us.
Inquire About This Product
basic information
【Lineup】 ■Flat ■Round ■Needle ■Chamfer *For more details, please refer to the catalog or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the catalog or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Our inspection target areas include printed circuit boards, semiconductor packages, and display panels. These are core components of information and communication devices that are growing increasingly due to advancements in IT, as well as widely adopted digital home appliances. Printed circuit boards, semiconductor packages, and display panels are evolving at an astonishing speed, and higher precision technologies are required in inspections. Our company holds a significant share in these inspection fields that demand cutting-edge technology, and we have delivered numerous products recognized as "de facto standards" in the industry worldwide.