A semiconductor testing probe that can be customized with various selections for the probe tip material, surface treatment, tip shape, etc., to match the measurement target device!
Probes for semiconductor testing can be selected according to the measurement environment. - Probes made from our unique alloy material that enhance contact performance for lead-free applications. - Heat-resistant probes that utilize special springs to avoid load reduction due to thermal effects. - High-level non-magnetic material probes that can also be used for testing magnetic sensor components. - Short high-frequency probes that maximize signal transmission characteristics. We respond to various user requests. 【Features】 ■ Excellent quality backed by years of experience ■ A wide range of products ■ Various selections available for probe tip material, surface treatment, tip shape, etc., tailored to the measurement target device ■ Custom specifications are also available, allowing for arbitrary settings of total length, tip diameter, and spring pressure beyond standard specifications. *For details, please request materials or view the PDF data available for download.
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basic information
We offer various probes to meet the diverse needs of our users, including a PB-free probe made with our unique alloy material at the probe tip, a heat-resistant probe that employs a special spring to avoid load reduction due to thermal effects, a high-level non-magnetic material probe that can also be used for inspecting magnetic sensor components, and a short high-frequency probe that maximizes signal transmission characteristics. Due to our in-house design and manufacturing, we can provide customized products starting from small quantities. We contribute to solving issues in inspection processes faced by users, such as extending probe lifespan, improving characteristics, and reducing costs.
Price information
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Applications/Examples of results
○ Various package inspection applications such as BGA, CSP, QFP, SON (IC sockets) ○ Wafer inspection applications (probe cards) ○ Other electronic component inspection applications
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Company information
Our company is a manufacturer that has developed and designed inspection equipment essential for quality assurance. Since our founding in 1984, we have started manufacturing and selling various inspection jigs, specializing in probe pins and their application products. Since then, we have responded to customer needs in various markets, including semiconductor component inspection jigs such as probe cards and IC sockets, as well as liquid crystal panel inspection jigs. As a leading company in the industry, we have refined and honed our precision processing and assembly technology over many years. Keeping pace with the changing times, as a "TOTAL TEST SOLUTION" provider, we will continue to tackle the challenges in inspection operations with various products and services as a good partner for our customers. In recent years, we have also been providing the technology and know-how we have accumulated in producing our products to our customers through our EMS business. In addition to our unique skills, we also offer various support in manufacturing by matching our customers with partner companies and related firms. Seiken will always challenge itself, create new value, and pave the way for the future of manufacturing in Japan.
![Semiconductor Testing [Contact Probes, IC Sockets, Probe Cards]](https://image.mono.ipros.com/public/product/image/6d6/2000410005/IPROS91145408194563330894.jpeg?w=280&h=280)
