We were able to significantly improve the performance of the probes even in high current measurements! It is also possible to increase the allowable current value, including the housing.
Recently, the conditions for inspection targets have become stricter, such as lead-free solder, contact with aluminum electrodes, and high current measurements, leading to cases where traditional processing is insufficient in performance. CNTs are strong against current and heat and have features that improve contact with aluminum. By incorporating them into the gold plating of probes, we have successfully enhanced the electrical performance of the gold plating. As a result, even when the contact probe is in contact with aluminum electrodes, it can maintain stable contact for a longer period. Additionally, in high current measurements where traditional pins would physically break due to current overload, we have significantly improved the performance of the probes. *For more details, please refer to the PDF document or feel free to contact us.*
Inquire About This Product
basic information
【Features】 ■ Strong against current and heat ■ Improved contact with aluminum ■ Successfully enhanced the electrical performance of gold plating ■ Can maintain stable contact for a long time even with aluminum electrodes ■ Significantly improved probe performance even in high current measurements *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（2）
Download All Catalogs
Company information
Our company is a manufacturer that has developed and designed inspection equipment essential for quality assurance. Since our founding in 1984, we have started manufacturing and selling various inspection jigs, specializing in probe pins and their application products. Since then, we have responded to customer needs in various markets, including semiconductor component inspection jigs such as probe cards and IC sockets, as well as liquid crystal panel inspection jigs. As a leading company in the industry, we have refined and honed our precision processing and assembly technology over many years. Keeping pace with the changing times, as a "TOTAL TEST SOLUTION" provider, we will continue to tackle the challenges in inspection operations with various products and services as a good partner for our customers. In recent years, we have also been providing the technology and know-how we have accumulated in producing our products to our customers through our EMS business. In addition to our unique skills, we also offer various support in manufacturing by matching our customers with partner companies and related firms. Seiken will always challenge itself, create new value, and pave the way for the future of manufacturing in Japan.
![[Free Support] Key Points for Selecting High Current Contact Probes](https://image.mono.ipros.com/public/product/image/203351/IPROS2320661915865285581.png?w=280&h=280)
![[Free Support] Resolving Probe Contact Issues in Power Device Power-On Testing](https://image.mono.ipros.com/public/default/object/noimage_l.gif?w=280&h=280)
