Create inspection programs using basic libraries! For inspecting wafers and printed circuit boards, etc.
At Japan System Co., Ltd., we design, manufacture, and provide systems tailored to customer needs, including image processing and automatic waveform processing judgment. "CLIP MICRO" is a high-resolution image diagnostic system capable of inspecting debris on wafers and films, glass printing, and patterns on printed circuit boards. Using a basic library for measurement, defect detection, and debris detection, we create inspection programs tailored to the target. 【Features】 - Capable of inspecting debris on wafers and films, glass printing, and patterns on printed circuit boards - Utilizes a basic library for measurement, defect detection, and debris detection - Creates inspection programs tailored to the target - Focus: Auto-focus *For more details, please refer to the PDF document or feel free to contact us.
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【Objective Lens and Resolution Measurement Field】 <Objective Lens Magnification / Resolution / Measurement Field> ■X5 / 0.68μm / 5440μm ■X10 / 0.34μm / 2720μm ■X20 / 0.17μm / 1360μm ■X50 / 0.068μm / 680μm *For more details, please refer to the PDF document or feel free to contact us.
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【Usage】 ■ Inspection of waste from wafers, films, printed circuit boards, and glass printing patterns. *For more details, please refer to the PDF document or feel free to contact us.
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We design, manufacture, and provide systems for image processing, automatic waveform processing judgment, according to customer needs.