Tabletop X-ray diffractometer (XRD) Aeris

At this year's JASIS 2022, we have expanded the number of booths compared to last year, allowing you to see more devices. We will showcase tabletop X-ray diffraction devices, X-ray fluorescence analyzers, laser diffraction particle size distribution measurement devices, as well as accessories for dynamic particle image analysis, dynamic light scattering particle size, zeta potential, and molecular weight measurement devices. Additionally, we have a well-equipped panel exhibition area, so please be sure to visit us at Makuhari Messe. Booth: Space Number 6B-407 Spectris plc Malvern Panalytical

Spectris plc's Malvern Panalytical division will begin selling the desktop X-ray diffraction device Aeris, equipped with transmission measurement and thin film measurement capabilities, starting in April 2021. **Features of the new Aeris:** - Detects crystal phases and polymorphs below 1% - While being a desktop device, it can be expanded to include thin film X-ray diffraction and transmission methods - Safe operability that allows sample loading and measurement without opening and closing the device - Horizontal sample method eliminates concerns about sample drop-off and contamination between samples **Background for Aeris Function Expansion:** We are launching a renewed model with significantly enhanced functions. Specifically, the expansion of thin film XRD (GIXRD) measurement capabilities now allows for the measurement of crystallinity and residual stress in thin films and coating materials. Additionally, the expansion of transmission measurement capabilities reduces the influence of orientation during sample pretreatment, enabling more accurate data to be obtained even from samples like formulation materials. The new Aeris is a multipurpose desktop X-ray diffraction device that can efficiently provide high-quality data from polycrystalline materials and is designed for use in all environments. The traditional functions have also been retained in this renewal.