From development to quality control! A super high-performance X-ray diffractometer that enables various forms of sample analysis.
The newly developed MultiCore Optics, equipped in the multipurpose X-ray diffraction device Empyrean, enables easy measurement of diverse samples with simple operations. With just one device, it features multipurpose XRD capabilities that capture various highlights of materials from powders to thin films, nanomaterials to solids, at different angles! Applications can be handled in various ways, from a simple configuration that adds a few slits and analysis software to the standard setup, to a top-performance configuration using dedicated optics, light sources, and detectors. 【Features】 ■ Evaluation of products with different raw materials and formulations ■ Strong support for urgent analysis of unknown samples or development products ■ Suitable for efficient measurement of diverse samples ■ Easy operation ■ Over 30% improvement in sample throughput ■ Over 40% higher sensitivity and speed for impurity detection ■ Reduction of errors and omissions in setting multiple measurement conditions ■ 30% reduction in user training time *For more details, please refer to our website.
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basic information
**Applications** 1. Applications for Powder Polycrystalline Samples - Qualitative and quantitative analysis of crystal phases (Rietveld method) - Crystallinity analysis, crystallite size, crystal structure analysis and refinement - Confirmation of crystal state using Debye rings with 2D detectors, and observation of conditions such as temperature, humidity, and pressure 2. Applications for Thin Film Samples - Qualitative analysis of crystal phases, X-ray reflectivity, thin film stress analysis - Orientation analysis, in-plane diffraction, epitaxial thin film analysis - Reciprocal space mapping, observation under variable temperature conditions 3. Applications for Nanomaterials - Small-angle X-ray scattering (SAXS), crystallite size analysis, amorphous quantification - Local structure (PDF) analysis, observation of crystallization processes 4. Applications for Bulk Samples - X-ray CT (Computed Tomography), micro-region analysis - Orientation analysis, stress analysis
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Applications/Examples of results
●Battery materials: Crystal structure analysis ●Pharmaceuticals: Crystal polymorphism screening ●Metals: Residual stress, pole measurement, degradation evaluation ●Thin films: Epitaxial films, reciprocal lattice mapping, stress analysis ●Nanomaterials: Small-angle and wide-angle X-ray scattering, crystal strain, etc.
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Company information
We are the Japan division of Malvern Panalytical, a company that provides particle measurement devices and X-ray analysis equipment. Based in Tokyo and Kobe, we have a total of six sales offices and two application laboratories across the country, where we offer sales, services, and support for particle measurement and X-ray analysis devices, as well as various events such as seminars. Malvern, which has products in particle measurement and thermal analysis (calorimetry), merged with Panalytical, a manufacturer of X-ray diffraction and fluorescence X-ray analysis equipment, in 2018. The integration of these two leading companies in their respective fields allows us to provide cutting-edge solutions to a wide range of industries involved in R&D, process control, quality management, and material property analysis.
![[Analysis Case] Structural Refinement of Powdered Crystalline Materials Using Rietveld Analysis Method](https://image.mono.ipros.com/public/product/image/ef7/2001514289/IPROS10469214203379498625.jpg?w=280&h=280)
![[Analysis Case] Measurement of Residual Stress in Metal Materials Before and After Load Application Using XRD](https://image.mono.ipros.com/public/product/image/d52/2000780189/IPROS93903369159255824822.png?w=280&h=280)
