Evaluation case of spherical shape samples
In AES analysis, the SEM observation function is included, allowing for the measurement of specific areas on the sample surface. Additionally, since measurements can be taken in sub-micrometer micro-regions, it is possible to target specific areas for measurement not only on flat samples like substrates but also on samples with spherical or curved shapes, which are less affected by curvature. Below is an example of evaluating the oxide film thickness on solder ball surfaces with different surface shapes.
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For detailed data, please refer to the catalog.
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Applications/Examples of results
Analysis of electronic components, manufacturing equipment, and parts.
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Download All Catalogs![[Analysis Case] Evaluation of Oxide Film on Solder Ball Surface_C0528](https://image.mono.ipros.com/public/catalog/image/01/e4d/452980/IPROS86942333068713327331.jpeg?w=120&h=170)
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!