High cost-performance AFM/SPM probes
This is a probe for atomic force microscopy and scanning probe microscopy. It can be used for a wide range of applications. With a reflective coating (Au, Al), it enables high-sensitivity measurements, and you can choose from many models with different cantilever shapes, resonance frequencies, and force constants that are suitable for your samples. Conductive coatings (Au, Pt, TiN, W2C), magnetic coatings, and bare probes without back coatings are also available. - Golden Probe: An excellent probe with an Au reflective coating and a curvature radius of 6 nm (typical). - ETALON Probe: An inexpensive probe with controlled tolerances for resonance frequency and force constant. It has different types of cantilevers at both ends of the chip. - TOP VISUAL Probe: A protruding probe that allows observation of the tip position from directly above, enabling precise positioning on the sample surface.
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basic information
This is a probe for atomic force microscopes and scanning probe microscopes. It is manufactured in a compatible chip size to be used with many types of atomic force microscopes and scanning probe microscopes. In addition to conductive coatings (Au, Pt, TiN, W2C) and magnetic coatings, bare probes without back coatings are also available.
Price range
Delivery Time
※The delivery time varies depending on the model and quantity, so please feel free to contact us.
Applications/Examples of results
- Scanning Probe Microscope - Atomic Force Microscope (AFM) - Kelvin Probe Microscope (KPM), Electrostatic Force Microscope (EFM) - Magnetic Force Microscope (MFM) - Force Measurement - Nanomanipulation and others
Detailed information
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Golden Probe: An excellent probe with a curvature radius of 6 nm (typical) coated with Au reflection.
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ETALON probe: An inexpensive probe with controlled tolerances for resonance frequency and stiffness constant. It has different types of cantilevers at both ends of the chip.
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TOP VISUAL Probe: A protruding type probe that allows observation of the tip position of the cantilever from directly above. It enables precise positioning on the sample surface.
Line up（20）
| Model number | overview |
|---|---|
| 【 Golden Probe 】 | Au backside reflective coating, tip curvature radius 6 nm (typical) |
| CSG01 | 【Resonant frequency (typical)】 9.8 kHz, 【Spring constant (typical)】 0.03 N/m |
| CSG10 | 【Resonant frequency (typical)】 22 kHz, 【Spring constant (typical)】 0.11 N/m |
| CSG30 | 【Resonant frequency (typical)】 48 kHz, 【Spring constant (typical)】 0.6 N/m |
| FMG01 | 【Resonant frequency (typical)】 60 kHz, 【Spring constant (typical)】 3 N/m |
| NSG03 | 【Resonant frequency (typical)】 90 kHz, 【Spring constant (typical)】 1.74 N/m |
| NSG01 | 【Resonant frequency (typical)】 150 kHz, 【Spring constant (typical)】 5.1 N/m |
| NSG10 | 【Resonant frequency (typical)】 240 kHz, 【Spring constant (typical)】 11.8 N/m |
| NSG30 | 【Resonant frequency (typical)】 320 kHz, 【Spring constant (typical)】 40 N/m |
| CSG11 | 【Resonant frequency (typical)】 21 & 11 kHz, 【Spring constant (typical)】 0.1 & 0.05 N/m |
| 【 ETALON Probe 】 | Au backside reflective coating, tip curvature radius < 10 nm (typical), low dispersion resonant frequency and spring constant |
| HA_C | 【Resonant frequency (typical)】 37 & 19 kHz, 【Spring constant (typical)】 0.65 & 0.26 N/m |
| HA_CNC | 【Resonant frequency (typical)】 46 & 66 kHz, 【Spring constant (typical)】 1 & 1.5 N/m |
| HA_FM | 【Resonant frequency (typical)】 114 & 77 kHz, 【Spring constant (typical)】 6 & 3.5 N/m |
| HA_NC | 【Resonant frequency (typical)】 235 & 140 kHz, 【Spring constant (typical)】 12 & 3.5 N/m |
| HA_HR | 【Resonant frequency (typical)】 380 & 230 kHz, 【Spring constant (typical)】 34 & 17 N/m |
| 【 TOP VIASUAL Probe 】 | Al backside reflective coating, tip curvature radius 6 nm (typical), protruding type probe |
| VIT_C-A | 【Resonant frequency (typical)】 16 kHz, 【Spring constant (typical)】 0.3 N/m |
| VIT_P/IR | 【Resonant frequency (typical)】 300 kHz, 【Spring constant (typical)】 50 N/m |
| VIT_P | 【Resonant frequency (typical)】 300 kHz, 【Spring constant (typical)】 50 N/m |
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Company information
MSH Systems Co., Ltd. introduces and provides cutting-edge scientific technologies and their products from both domestic and international sources to universities, research institutions, and corporate clients in Japan as quickly as possible, contributing to the realization of a richer future society. With 30 years of sales and service experience in the science and technology fields, along with strong trust relationships and responsible execution with our clients, we will act with all our efforts to become a good partner for everyone. Our ultimate goal is to ensure the satisfaction of not only our customers and manufacturers but also everyone involved with us.