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  6. High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

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last updated:Aug 27, 2020

MSHシステムズ
MSHシステムズ
  • Official site

This is a probe with a long extra tip at the tip end. It is effective for measuring samples with deep grooves and vertical sidewalls.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a long extra tip at the tip's end. It is effective for measuring samples with deep grooves that a standard tip cannot reach, as well as vertical sidewalls that are difficult to measure. - Whisker Probe: A probe with an extra tip that extends at an angle of 10° or 20° at the tip's end. The angle can be selected to be perpendicular to the sample. - PHA Probe: A probe with an elongated extra tip shaped like a drill.

    probeOther microscopesAnalytical Equipment and Devices
whisker.jpg

High Aspect Ratio Type: High Aspect Ratio Probes for AFM/SPM

whisker.jpg
whisker.jpg
  • Related Link - https://www.msh-systems.com/products/life-science-…

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basic information

This is a probe for atomic force microscopy and scanning probe microscopy. It has a long extra tip at the tip's end, making it effective for measuring samples with deep grooves that a standard tip cannot reach, as well as vertical sidewalls that are difficult to measure.

Price range

Please contact us for details

Delivery Time

Please contact us for details

※The delivery time varies depending on the model and quantity, so please feel free to contact us.

Applications/Examples of results

- High-resolution measurements of scanning probe microscopy (SPM) - High-resolution measurements of atomic force microscopy (AFM)

Detailed information

  • whisker.jpg

    Whisker Probe: A probe with an extra tip extended at an angle of 10° or 20° at the tip end. The angle can be selected to be perpendicular to the sample.

  • PHA.png

    PHA probe: A probe with an extra tip shaped like a long, slender drill.

Line up(7)

Model number overview
[Whisker Probe] A probe with an extra tip extended at an angle of 10° or 20° at the tip end. The angle can be selected to be vertical to the sample.
CSC05_10 [Resonant Frequency (typical)] 22 kHz, [Spring Constant (typical)] 0.11 N/m, [Inclination Angle] 10°
CSC05_20 [Resonant Frequency (typical)] 22 kHz, [Spring Constant (typical)] 0.11 N/m, [Inclination Angle] 20°
NSC05_10 [Resonant Frequency (typical)] 240 kHz, [Spring Constant (typical)] 11.8 N/m, [Inclination Angle] 10°
NSC05_20 [Resonant Frequency (typical)] 240 kHz, [Spring Constant (typical)] 11.8 N/m, [Inclination Angle] 20°
[PHA Probe] A probe with an extra tip in a drill-like elongated shape.
PHA_NC [Resonant Frequency (typical)] 238 & 140 kHz, [Spring Constant (typical)] 12 & 3.5 N/m

catalog(1)

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AFM/SPM Related Products Catalog

AFM/SPM Related Products Catalog

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Company information

MSHシステムズ

MSHシステムズ

Optical Instruments

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MSH Systems Co., Ltd. introduces and provides cutting-edge scientific technologies and their products from both domestic and international sources to universities, research institutions, and corporate clients in Japan as quickly as possible, contributing to the realization of a richer future society. With 30 years of sales and service experience in the science and technology fields, along with strong trust relationships and responsible execution with our clients, we will act with all our efforts to become a good partner for everyone. Our ultimate goal is to ensure the satisfaction of not only our customers and manufacturers but also everyone involved with us.

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