AFM/SPM probes boasting long lifespan and high durability with diamond coatings and single crystal diamonds.
This is a probe for atomic force microscopy and scanning probe microscopy. It features a diamond coating on the tip, or the tip itself is made of single crystal diamond, providing high stability, wear resistance, and durability for a long-lasting probe. ● Diamond Coated Probes - DCP Series: Probes with conductivity due to nitrogen-doped diamond coating. - HA_DCP Series: Probes with cantilevers at both ends of the chip and two different diamond-coated tips. ● Single Crystal Diamond Probes - DEP Series: Probes with conductivity, treated with boron-doped diamond coating on single crystal diamond. - DRP Series, DPRS Series: Probes designed for applications involving high mechanical loads and scratch tests. - FD Series: Probes that are insensitive to static electricity on the sample surface, making them easy to approach and suitable for topography imaging.
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basic information
This is a probe for atomic force microscopy and scanning probe microscopy. It features a diamond coating on the tip, or the tip itself is made of single crystal diamond, providing high stability, wear resistance, and durability for a long-lasting probe. Its high wear resistance allows for repeated measurements, making it useful for applications such as scratching and nano-lithography.
Price range
Delivery Time
※The delivery time varies depending on the model and quantity, so please feel free to contact us.
Applications/Examples of results
- Scanning Probe Microscope - Atomic Force Microscope (AFM) - Kelvin Probe Microscope (KPM), Electrostatic Force Microscope (EFM) - Scratching - Nano Lithography - Repeated Measurement and others
Detailed information
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DCP Series: Probes with conductivity due to nitrogen-doped diamond coating.
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HA_DCP series: A probe with cantilevers at both ends and two different tips coated with diamond.
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DEP series: Probes with conductivity treated with boron-doped diamond coating on single crystal diamond.
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- DRP series, DPRS series: Probes designed for applications such as high mechanical loads and scratch tests.
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FD series: A probe that is insensitive to static electricity on the sample surface, making it easy to approach and suitable for topography imaging.
Line up（21）
| Model number | overview |
|---|---|
| ●Diamond Coated Probe | |
| 【DCP Series】 | Conductive probe coated with nitrogen-doped diamond |
| DCP10 | 【Resonant Frequency (typical)】 255 kHz, 【Spring Constant (typical)】 11.5 N/m |
| DCP20 | 【Resonant Frequency (typical)】 420 kHz, 【Spring Constant (typical)】 48 N/m |
| 【HA_DCP Series】 | Probe with two different tips coated with diamond |
| HA_C_DCP | 【Resonant Frequency (typical)】 48 & 26 kHz, 【Spring Constant (typical)】 1.4 & 0.7 N/m |
| HA_FM_DCP | 【Resonant Frequency (typical)】 157 & 112 kHz, 【Spring Constant (typical)】 14.5 & 8.3 N/m |
| HA_HR_DCP | 【Resonant Frequency (typical)】 580 & 330 kHz, 【Spring Constant (typical)】 85 & 35 N/m |
| ●Single Crystal Diamond Probe | |
| 【DEP Series】 | Conductive probe with boron-doped diamond coating on single crystal diamond |
| DEP01 | 【Resonant Frequency (typical)】 65 kHz, 【Spring Constant (typical)】 2.8 N/m |
| DEP30 | 【Resonant Frequency (typical)】 180 kHz, 【Spring Constant (typical)】 40 N/m |
| 【DRP, DRPS Series】 | Probes for high mechanical load and scratch testing |
| DRP30_SS | 【Resonant Frequency (typical)】 180 kHz, 【Spring Constant (typical)】 40 N/m |
| DRPS_In_C | 【Resonant Frequency (typical)】 750 kHz, 【Spring Constant (typical)】 350 N/m, 【Tip Curvature Radius (typical)】 10 nm, with measurement data |
| DRP_In_C | 【Resonant Frequency (typical)】 750 kHz, 【Spring Constant (typical)】 350 N/m, 【Tip Curvature Radius (typical)】 25 nm, with measurement data |
| DRPS_In | 【Resonant Frequency (typical)】 750 kHz, 【Spring Constant (typical)】 350 N/m, 【Tip Curvature Radius (typical)】 10 nm |
| DRP_In | 【Resonant Frequency (typical)】 750 kHz, 【Spring Constant (typical)】 350 N/m, 【Tip Curvature Radius (typical)】 25 nm |
| 【FD Series】 | Probes suitable for easy approach and topography imaging |
| HA_C/FD | 【Resonant Frequency (typical)】 19 kHz, 【Spring Constant (typical)】 0.26 N/m |
| HA_NC/FD | 【Resonant Frequency (typical)】 140 kHz, 【Spring Constant (typical)】 3.5 N/m |
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Company information
MSH Systems Co., Ltd. introduces and provides cutting-edge scientific technologies and their products from both domestic and international sources to universities, research institutions, and corporate clients in Japan as quickly as possible, contributing to the realization of a richer future society. With 30 years of sales and service experience in the science and technology fields, along with strong trust relationships and responsible execution with our clients, we will act with all our efforts to become a good partner for everyone. Our ultimate goal is to ensure the satisfaction of not only our customers and manufacturers but also everyone involved with us.
![[Standard Type] AFM/SPM Probe](https://image.mono.ipros.com/public/product/image/cc7/2000450337/IPROS44932941016124116974.jpeg?w=280&h=280)
