Defects in expansion can also be measured! SemiScope enables spectral line analysis.
The "SemiScope PLIS-TEC" is a groundbreaking measurement device for the study of crystal defects using photoluminescence (PL). It allows for the simultaneous measurement of spectra from a selected line segment in a PL imaging image, dividing that segment into 1000 points. Additionally, by spectrally analyzing the line segment, it can accurately measure spectra even for defects that are difficult to pinpoint, such as base plane transitions. 【Features】 ■ Supports spectral line analysis ■ For the study of crystal defects ■ The excitation light density is approximately three orders of magnitude lower than that of conventional PL spectral measurements ■ Capable of measuring extended defects ■ Accurately measures spectra even for defects that are difficult to locate *For more details, please refer to the PDF document or feel free to contact us.
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【Purpose】 ■Research on crystal defects *For more details, please refer to the PDF document or feel free to contact us.
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Photon Design Co., Ltd. is a manufacturer of spectroscopic measurement devices, including photoluminescence and Raman devices. We are constantly incorporating new technologies and striving for the highest performance in our equipment development. The recent trend of prioritizing management efficiency has also affected the field of research equipment. As highly marketable research devices are being commercialized one after another, the production of top-quality research devices with low sales numbers is becoming increasingly rare. However, Photon Design believes that for research equipment that plays a crucial role in cutting-edge scientific research challenging the unknown, there can be no compromise on performance. As a manufacturer of spectroscopic measurement devices, we will continue to seek the highest performance and develop our equipment.