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  6. Semiconductor analysis

Semiconductor analysis

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last updated:Nov 16, 2019

イオンテクノセンター
イオンテクノセンター
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Analysis can be performed using various methods tailored to different purposes of various semiconductors!

We provide support for research and development through various methods such as observation of fine semiconductor shapes, evaluation of crystallinity, measurement of impurity concentration, hardness measurement, and failure analysis.

    Contract Analysis
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Semiconductor analysis

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  • Related Link - https://iontc.co.jp/project/breakdown_maintenance/

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Semiconductor Material Analysis Items Atomic-level structural observation, crystal structure, dislocation density, film thickness Surface morphology, cross-sectional structure (film thickness) Crystallinity (plane orientation), periodic structure of layered films Surface composition, bonding state, depth distribution Impurity concentration, depth analysis Crystal structure, stress-strain Constituent elements, composition Surface Young's modulus, hardness

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Semiconductor analysis is widely utilized by domestic companies and universities.

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Semiconductor analysis

Semiconductor analysis

TECHNICAL
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イオンテクノセンター

イオンテクノセンター

Testing, Analysis and Measurement

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The Ion Tech Center is a professional group that provides consulting and technical development support in "ion implantation," "physical analysis," and research and development. We aim to be a good partner for companies and university researchers as a creative laboratory equipped with cutting-edge technology and facilities that meet the demands of the times.

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