We provide contract analysis services equipped with devices for physical analysis, and we also offer on-site analysis.
The main equipment includes "HR-TEM," "Q-pole type SIMS," "μESCA," and "RAMAN." We have accumulated know-how in micro and nano-level surface analysis, allowing us to provide highly reliable data in a short period. We also offer advice on the analysis of unknown samples. 【Surface Analysis: X-ray Photoelectron Spectroscopy (ESCA/XPS)】 ○ A method that identifies elements and analyzes composition and chemical bonding states by analyzing the energy of photoelectrons emitted from the surface of a sample when irradiated with X-rays, from a depth of a few nanometers. ○ It is suitable for surface analysis of insulators and allows for depth analysis using Ar ion etching and localized analysis with a beam diameter of 10 μm. ● For more details, please download the catalog or contact us.
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basic information
【Features】 ○ A method for identifying elements and analyzing composition and chemical bonding states through energy analysis of photoelectrons emitted from the surface of a sample when irradiated with X-rays, at depths of a few nanometers. ○ Suitable for surface analysis of insulators, allowing for depth analysis using Ar ion etching and localized analysis with a beam of 10 μm in diameter. ● For more details, please download the catalog or contact us.
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For more details, please contact us.
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Applications/Examples of results
- Evaluation of composition depth distribution of multilayer films - Evaluation of interfacial state of multilayer films - Evaluation of surface elemental and chemical bonding states - Evaluation of surface elemental distribution
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Company information
The Ion Tech Center is a professional group that provides consulting and technical development support in "ion implantation," "physical analysis," and research and development. We aim to be a good partner for companies and university researchers as a creative laboratory equipped with cutting-edge technology and facilities that meet the demands of the times.
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