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  6. CHRocodile 2IT DW1000

CHRocodile 2IT DW1000

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last updated:Mar 30, 2022

プレシテック・ジャパン
プレシテック・ジャパン
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Introducing the CHRocodile 2IT DW1000 with analog I output!

We would like to introduce the 'CHRocodile 2IT DW1000' handled by PreciTech Japan Co., Ltd. The light source is NIR SLD. The measurement range is 80um to 8200um (n=1) and 20um to 2000um (n=3.7). Additionally, it comes with a 5-axis encoder. 【Product Specifications】 ■ Light Source: NIR SLD ■ Measurement Range: 80um to 8200um (n=1), 20um to 2000um (n=3.7) ■ External Trigger, Synchronous IO ■ 5-axis Encoder Included ■ Ethernet, RS422 ■ Analog I Output Included *For more details, please refer to the PDF document or feel free to contact us.

    Other measurement, recording and measuring instrumentsOptical Measuring Instruments
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CHRocodile 2IT DW1000

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2019-12-19_09h46_20.png
  • Related Link - https://www.precitec.de/jp/precitec-group-start-pa…
  • Special site - Product/service details - https://pr.mono.ipros.com/precitec-group/product/

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【Doped Wafer Measurement Results】 ■Doped wafer ・P-(1-150Ω・cm) ・N-(1-200Ω・cm) ・P+(0.01-0.02Ω・cm) ・P++(0.005-0.01Ω・cm) excluding 980μm ■Note: The slurry has an impact on the light peak signal during measurement ■For slurry thickness of 0.6mm to 1.5mm, 215-545um (p++) *For more details, please refer to the PDF document or feel free to contact us.

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Applications/Examples of results

[Keywords: Applications, Measurement Items, Benefits, etc.] Non-contact sensors, optical sensors, spectroscopic interference method, thickness, thin films, thick films, gaps, TTV (Total Thickness Variation), shape, appearance, edges, slopes, measurement, inspection, high speed, high precision, inline, monitoring, in-situ, during processing, before and after processing, polishing, semiconductors, semiconductor wafers, wafer bonding, Si wafers, doped wafers, impurity wafers, GaAs, InP, SiC, LiNbO3 (LN), LiTaO3 (LT), GaN, SiP, Al2O3 (sapphire), transparent, transparency, gloss, mirror finish, simple.

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CHRocodile 2IT DW1000

CHRocodile 2IT DW1000

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Thickness measurement application

Thickness measurement application

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Case Study Collection: Thickness Measurement and 3D Shape Measurement of Semiconductor Wafers Using Non-Contact Sensors

Case Study Collection: Thickness Measurement and 3D Shape Measurement of Semiconductor Wafers Using Non-Contact Sensors

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プレシテック・ジャパン

プレシテック・ジャパン

Testing, Analysis and Measurement

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Presitech is a specialist in laser material processing and optical measurement technology. We are not just a supplier of systems and components, but a professional partner in ensuring a smooth processing process for our customers. We offer consultations from the foundational stage and accurately consult with customers on their requests and objectives. We understand that the key to success in unique processing processes lies in the four components of exhibition, monitoring, processing, and control. Only by doing so can we provide appropriate solutions for our customers' applications. Our high-quality products, such as laser processing heads, quality monitoring systems, and optical measurement systems for spacing/thickness measurement, allow customers to directly benefit from our decades of experience. Our optical sensors are characterized by the highest precision and dynamic adaptability. Furthermore, they detect accurate values even in high-speed measurements.

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