Achieved a minimum pitch of 30μm matrix! Semiconductor test fixtures capable of narrow pitch probe settings.
A "probe card" is a tool used in the semiconductor testing process for electrical testing of LSI (large-scale integrated circuit) chips formed on silicon wafers during the wafer test process of LSI manufacturing. By using wire probes, it is possible to position the probes vertically, allowing for more flexible probe arrangements. Additionally, by making vertical contact with the test object, significant improvements in inspection marks (dents) compared to conventional cantilever-type probes can be expected. 【Features】 ■ Vertical contact ■ Pin pitch ■ Multi-pin configuration, multi-surface simultaneous measurement *For more details, please download the PDF or feel free to contact us.
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Koyo Technos has been engaged in the manufacturing of inspection fixtures for printed circuit boards, semiconductor packages, and other advanced inspection devices, which can be considered the heart of cutting-edge inspection equipment, since its establishment. As market demands for multifunctionality, high density, high performance, and ultra-compactness continue to rise, our product lineup, backed by advanced technology, consistently receives unwavering recognition in all advanced fields. Our consistent theme is to accurately respond to user demands with foresight that captures the trends of the times. This micron-level precision technology, which does not allow competitors to catch up, has generated strong trust in the market.