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  6. [Example] 'Particle-PLUS' DC Magnetron Sputter

[Example] 'Particle-PLUS' DC Magnetron Sputter

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Particle-PLUS

last updated:Jun 29, 2023

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A case study of the DC magnetron sputtering method using process plasma, known as 'Particle-PLUS'.

"Particle-PLUS" is a simulation software suitable for research, development, and manufacturing of devices and materials using plasma. - It excels in low-pressure plasma analysis. - It specializes in plasma analysis within vacuum chambers, enabling fast simulations of film deposition rates and more. - It is adept at plasma simulations in low-pressure gases, where calculations using fluid models are challenging. - It supports both 2D and 3D, allowing efficient analysis even for complex models. - As a strength of our in-house developed software, customization to fit the customer's equipment is also possible. ◆ Supports various cases ◆ - Magnetron sputtering - PVD, plasma CVD - Capacitive coupled plasma (CCP) - Dielectric barrier discharge (DBD) - Electrophoresis, etc. ◆ Outputs various calculation results ◆ - Potential distribution - Density distribution/temperature distribution/generation distribution of electrons and ions - Particle flux and energy flux to the walls - Energy spectrum of electrons and ions at the walls - Density distribution/temperature distribution/velocity distribution of neutral gas, etc. *For more details, please feel free to contact us.

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DCマグネトロンスパッタリング_図1.png

[Example] 'Particle-PLUS' DC Magnetron Sputter

DCマグネトロンスパッタリング_図1.png
DCマグネトロンスパッタリング_図1.png DCマグネトロンスパッタリング_図2.png DCマグネトロンスパッタリング_図3.png DCマグネトロンスパッタリング_図4.png DCマグネトロンスパッタリング_図5.png DCマグネトロンスパッタリング_図6.png
  • Related Link - http://www.wavefront.co.jp/CAE/particle-plus/
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basic information

**Features** - The time scheme uses an implicit method, allowing for stable time evolution calculations over a large time step Δt compared to conventional methods. - The collision reaction model between neutral gas and electrons and ions employs the Monte Carlo Scattering method, enabling accurate and rapid calculations of complex reaction processes. - The neutral gas module determines the initial neutral gas distribution used in the plasma module above, allowing for quick evaluation of gas flow using the DSMC method. - The sputtered particle module assesses the behavior of atoms sputtered from the target in plasma and neutral gas environments, such as the flux distribution on opposing substrates, which can be evaluated in a short time. *For other functions and details, please feel free to contact us.*

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Delivery Time

P4

Applications/Examples of results

【Dual Frequency Capacitive Coupled Plasma】 - Optimization of voltage and other parameters to achieve high-density plasma - Damage to chamber walls - Optimization of power using external circuit models - It is possible to apply voltages to the electrode plates that align with real devices - The waveform of the applied voltage can be smooth and relatively realistic for simulation - Calculations are relatively stable to avoid applying excessive voltages 【DC Magnetron Sputtering】 - Uniformity of erosion dependent on magnetic field distribution - Adsorption distribution of sputtered materials on the substrate 【Pulsed Voltage Magnetron Sputtering】 - Optimization of the application time of pulsed voltage to efficiently sputter materials 【Ion Implantation】 - The influence of the substrate on the erosion distribution 【Time Evolution of Applied Voltage on Electrode Plates】 - It is possible to observe physical quantities that are difficult to measure experimentally, such as electron density and ion velocity distribution - By investigating electron density and ion velocity distribution, it is possible to examine the uniformity of the film and damage to the chamber walls - Changing calculation conditions allows for optimization of high-density plasma generation at low power

Detailed information

  • DCマグネトロンスパッタリング_図1.png

    DC magnetron sputtering

  • DCマグネトロンスパッタリング_図2.png

    Electric Potential and Electric Field_1

  • DCマグネトロンスパッタリング_図3.png

    Electric Potential and Electric Field_2

  • DCマグネトロンスパッタリング_図4.png

    Energy of plasma

  • DCマグネトロンスパッタリング_図5.png

    Frequency distribution of surface incident ions

  • DCマグネトロンスパッタリング_図6.png

    Ti deposition rate

catalog(16)

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Analysis software specialized for semiconductor-related equipment.

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Sputtering Device Analysis Software "Particle-PLUS"

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Particle-based Plasma Analysis Software 'Particle-PLUS'

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CVD device analysis software "Particle-PLUS"

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Handling CAE Solutions

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3D rarefied fluid analysis software 'DSMC-Neutrals'

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Film formation device analysis software 'DSMC-Neutrals'

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[Case Study] CCP Plasma Simulation Using the Particle-PLUS External Circuit Model

[Case Study] CCP Plasma Simulation Using the Particle-PLUS External Circuit Model

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[Case Study] Particle-PLUS Cylindrical Magnetron Device Plasma Sputtering Simulation

[Case Study] Particle-PLUS Cylindrical Magnetron Device Plasma Sputtering Simulation

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[Case Study] Particle-PLUS DC Magnetron Sputtering Simulation

[Case Study] Particle-PLUS DC Magnetron Sputtering Simulation

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[Case Study] Particle-PLUS DC Magnetron Sputtering (3D Calculation) Simulation

[Case Study] Particle-PLUS DC Magnetron Sputtering (3D Calculation) Simulation

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[Case Study] Particle-PLUS Opposing Target Sputtering Simulation

[Case Study] Particle-PLUS Opposing Target Sputtering Simulation

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[Case Study] Particle-PLUS Opposing Target Sputtering Simulation

[Case Study] Particle-PLUS Opposing Target Sputtering Simulation

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[Case Study] Particle-PLUS RF Magnetron Sputtering Simulation

[Case Study] Particle-PLUS RF Magnetron Sputtering Simulation

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Company information

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Our company develops and sells a "Maintenance Management System" for managing and operating various plants, factories, and other facilities and assets. Currently, this system is undergoing significant evolution into one that incorporates IoT technologies, such as sensor information and input from tablet devices, as well as AI technologies like machine learning, featuring functions for failure prediction and automatic scheduling. Additionally, as part of the recent trend towards digital transformation (DX), there is a growing movement to digitize and automate manufacturing processes and research and development sites in factories to enhance operational efficiency. In line with this trend, our company provides a solution aimed at improving efficiency in research and development environments, known as the Laboratory Information Management System (LIMS), which includes features such as workflow management, data tracking, data management, data analysis, and integration of electronic lab notebooks.

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