SPS evaluation device equipped with standard fluorescent X-ray analysis function!
The "Denbee Base SPS" is an SPS evaluation device capable of non-destructive assessment of samples with a maximum diameter of 300mm. Depending on the application, it can be equipped with various excitation light sources (ultraviolet, visible, infrared) and detectors. Samples can be placed directly for immediate evaluation. 【Features】 ■ Capable of evaluating new materials made by the SPS method ■ Immediate evaluation of items of interest ■ Automatic elemental mapping ■ Easy to operate ■ Specifications can be modified to meet requirements *For more details, please download the PDF or feel free to contact us.
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basic information
**Main Specifications (Excerpt)** ■ Mapping Function: Acquisition of fluorescent X-ray images through stage movement ■ Analysis Function: Measurement of fluorescent X-ray spectra, qualitative analysis, quantitative analysis (calibration curve method) ■ Target Elements: Si to U ■ X-ray Source: Maximum 40kV, 100uA, air-cooled; target can be selected from Ag/W/Pd/Rh *For more details, please download the PDF or feel free to contact us.*
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【Purpose】 ■Inspection ■Screening ■Defect Analysis ■Foreign Matter Analysis ■Material Development *For more details, please download the PDF or feel free to contact us.
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Our company is engaged in various businesses, including research and development and sales of applied measurement instruments, research and development and sales of laser application devices, and research and development and sales of sensors for visual, auditory, taste, tactile, and olfactory senses. We also handle SPS evaluation equipment such as 'Denbee Base SPS'. Please feel free to contact us if you have any inquiries.