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  6. Evaluation of membrane quality using EELS analysis method

Evaluation of membrane quality using EELS analysis method

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last updated:Jun 26, 2025

アイテス
アイテス
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EELS analysis for element identification allows for the comparison of the bonding states of materials!

Our company provides analysis and reliability evaluation services. EELS analysis and EDS analysis are analytical methods used for elemental identification by irradiating accelerated electrons onto TEM samples. In the case of "different carbon films," we conducted film quality evaluation in the nanoscale using the EELS analysis method, which is characterized by state analysis. In the EDS analysis, we detected trace amounts of N and O only in the Bottom film through spectral comparison. In the EELS analysis, the difference in the shoulder shapes of the two spectra allows for a comparison of the bonding states of N, O, and C present in the organic film. *For more details, please refer to the PDF document or feel free to contact us.

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Evaluation of membrane quality using EELS analysis method

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  • Related Link - https://www.ites.co.jp/analyze/index.html
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Comparison of EELS Analysis and EDS Analysis <EELS> ■ Parameters used for analysis: Energy loss electrons ■ Energy resolution: Below 1 eV ■ Advantages: State analysis, light element analysis (Li, B) ■ Disadvantages: Difficult to analyze a wide range of elements simultaneously ■ Measurement time: 5 seconds ■ TEM sample thickness: Approximately below 50 nm <EDS> ■ Parameters used for analysis: Characteristic X-rays ■ Energy resolution: Around 100 eV ■ Advantages: Analysis of all elements ■ Disadvantages: Difficult to separate peaks of elements with close energy ■ Measurement time: 30 seconds ■ TEM sample thickness: Approximately below 300 nm *For more details, please refer to the PDF document or feel free to contact us.*

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Evaluation of membrane quality using EELS analysis method

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Total support service for cross-section grinding, processing, observation, and analysis.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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