Spot Cooling and Heating Device for Rapid Cooling and Heating with Constant Temperature Air

Added a new "tip heater type" with a temperature change rate of 100°C/min to streamline the temperature characteristic evaluation of semiconductors and electronic devices.

A chamberless system that sprays air adjusted to temperatures ranging from -40 to +180°C, streamlining testing processes. It can be utilized in combination with various measuring instruments and analysis devices for temperature characteristic testing, failure analysis, and quality testing of semiconductors and electronic devices. 【Features】 ■ Improved Testing Efficiency The advanced heater type has a temperature change rate of 100°C/min (air temperature) and reduces the time for temperature cycling and thermal shock testing by compactly enclosing the sample with an attachment at the nozzle tip. This significantly reduces power consumption. ■ Flexibility The advanced heater type allows the nozzle to be positioned exactly where needed using a horizontal and vertical multi-joint arm. The rear heater type employs a flexible hose, enabling the nozzle to follow the movement of the sample or evaluation device. ■ Testing without a Chamber or Door Using a dedicated attachment, it is possible to cool and heat the sample without any obstructions such as observation window glass or metal from a constant temperature chamber. This enables the evaluation of various in-vehicle sensors, including image sensors (cameras) and millimeter-wave radar, as well as combined evaluations with 3D deformation strain measurement systems and infrared thermography, and non-destructive internal observation of secondary batteries, semiconductors, and printed circuit boards in combination with X-ray transmission devices.

Testing Equipment and Devices