A scanning atomic force microscope system that accelerates the automatic defect inspection for defect identification, scanning, and analysis by ten times.
The "Park NX-HDM" is an atomic force microscope capable of automatic defect inspection and sub-angstrom surface roughness measurement for media and substrates. It is extensively linked with optical inspection devices, significantly improving the throughput of automatic defect inspection. Additionally, it provides accurate sub-angstrom surface roughness measurements even in repeated measurements. 【Features】 ■ Automatic defect inspection for media and substrates ■ Accurate sub-angstrom surface roughness measurement ■ Cost reduction through true non-contact mode ■ Accurate AFM topography with low-noise Z detector *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
【Specifications】 ■Motor-driven XY stage ・Maximum travel range: 150 mm × 150 mm ・Repeatability error: 2 µm ■Motor-driven Z stage ・Z travel distance: 25 mm ・Resolution: 0.1 µm ・Repeatability error: <1 µm ■XY scanner range: 100 µm × 100 µm ■XY scanner resolution: 0.095 nm (20-bit position control) *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Purpose】 ■AFM suitable for automatic defect inspection and surface roughness measurement *For more details, please refer to the PDF document or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Our company is a specialized manufacturer of nano-measurement instruments that develops, produces, and sells highly accurate and user-friendly Atomic Force Microscopes (AFM) using innovative technology and automation software. We have established a global sales network in over 30 countries, and our Atomic Force Microscopes are used in various fields around the world. As a rapidly growing AFM company with world-class technological capabilities, we are committed to developing core technologies and excellent product development, leading the advancement of nanotechnology.