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  2. Testing, Analysis and Measurement
  3. Park Systems Japan
Testing, Analysis and Measurement
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Park Systems Japan

addressTokyo/Minato-ku/1-11-4 Nishishinbashi,
phone03-3219-1001
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last updated:Jul 15, 2026
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  • Products/Services(8)
  • catalog(17)
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Park Systems Japan Company Overview

A rapidly growing AFM manufacturer with the largest resources.

Our company is a specialized manufacturer of nano-measurement instruments that develops, produces, and sells highly accurate and user-friendly Atomic Force Microscopes (AFM) using innovative technology and automation software. We have established a global sales network in over 30 countries, and our Atomic Force Microscopes are used in various fields around the world. As a rapidly growing AFM company with world-class technological capabilities, we are committed to developing core technologies and excellent product development, leading the advancement of nanotechnology.

Business Activities

【Products Offered】 ■For Research  ・AFM for Small Samples  ・AFM for Large Samples ■For Production Lines  ・Fully Automatic AFM ■Bio and Chemical  ・Bio AFM & SICM

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Products/Services (8)

[New Release!] Atomic Force Microscope 'Park NX7' product image
[New Release!] Atomic Force Microscope 'Park NX7'
Atomic Force Microscope "Park NX-HDM" product image
Atomic Force Microscope "Park NX-HDM"
Atomic Force Microscope "Park NX-Wafer" product image
Atomic Force Microscope "Park NX-Wafer"
Atomic Force Microscope (AFM) "Park NX-3DM" product image
Atomic Force Microscope (AFM) "Park NX-3DM"

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catalog(17)

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Atomic Force Microscope (AFM) 'Park NX12' | Integrated analysis for AFM, SICM, and inverted optical microscopy for electrochemical research.

Atomic Force Microscope (AFM) 'Park NX12' | Integrated analysis for AFM, SICM, and inverted optical microscopy for electrochemical research.

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Atomic Force Microscope (AFM) 'Park NX15' | Compatible with 150mm wafers, achieving high precision and high reproducibility for versatile research applications.

Atomic Force Microscope (AFM) 'Park NX15' | Compatible with 150mm wafers, achieving high precision and high reproducibility for versatile research applications.

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Atomic Force Microscope (AFM) 'Park NX-Hivac' | Vacuum AFM for high-precision analysis of failure analysis and atmosphere-sensitive materials in a high vacuum environment.

Atomic Force Microscope (AFM) 'Park NX-Hivac' | Vacuum AFM for high-precision analysis of failure analysis and atmosphere-sensitive materials in a high vacuum environment.

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Atomic Force Microscope (AFM) 'Park FX300' | Supports large samples up to 300mm and automates high-precision, high-reproducibility nano measurements.

Atomic Force Microscope (AFM) 'Park FX300' | Supports large samples up to 300mm and automates high-precision, high-reproducibility nano measurements.

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news(1)

[Event Announcement] Nano Science Symposium 2026 Held | Cutting-edge Research in Semiconductors, All-Solid-State Batteries, and Surface Analysis

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How to utilize nano-level measurement and analysis technology in material development and product evaluation. We will explore its potential through the latest research examples at the "Nano Science Symposium 2026," to be held on Thursday, October 29, at the University of Tokyo. This symposium will introduce research in materials science, semiconductors, and life sciences using various surface analysis methods, including applications of scanning probe microscopy (SPM). We aim to share and exchange research information through lectures and poster sessions. We are pleased to welcome Professor Yusuke Mori from Osaka University for a special lecture on the theme "The Green Digital Society Enabled by GaN Crystals." ■ Notable Lecture Topics - Anti-fouling and antibacterial surfaces using zwitterionic polymers - Semiconductor devices and artificial optical devices using nanoimprint technology - Degradation analysis of all-solid-state batteries - Visualization of impedance distribution inside all-solid-state batteries using AFM We look forward to the participation of everyone involved in research and development of semiconductors, batteries, and polymer materials, as well as those engaged in surface analysis and evaluation. For participation details and inquiries, please check the official website below. https://nanoscientific.org/nss_japan/main

Oct 05, 2026

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Detailed information

Company name Park Systems Japan
Contact addresspostalcode 105-0003 Tokyo/ Minato-ku/ 1-11-4 Nishishinbashi,View on map TEL:03-3219-1001 FAX:03-3219-1002
Industry Testing, Analysis and Measurement
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