Atomic force microscope providing reliable data with the highest level of nanoscale resolution.
The "Park NX10" is an atomic force microscope (AFM) that can be easily operated at all stages, from sample setup to imaging, measurement, and analysis. With this product, users can focus more on innovative research based on better data and more time. 【Features】 ■ Accurate XY scanning without bowing due to crosstalk removal ■ Accurate AFM topography using a low-noise Z detector ■ Top-class chip lifespan, resolution, and sample protection with true non-contact (TM) mode ■ Nano-order surface analysis of various materials such as semiconductors, polymers, battery materials, and carbon-based materials (see image gallery) *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Main Features】 ■ Shape Measurement (Non-contact/Contact/Tapping) ■ Electrical Properties (C-AFM/KPFM/EFM, etc.) ■ Mechanical Properties (PinPoint/LFM/FMM, etc.) ■ Induction Properties/Piezoelectric Properties (PFM, etc.) ■ Magnetic Properties (MFM) *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Our company is a specialized manufacturer of nano-measurement instruments that develops, produces, and sells highly accurate and user-friendly Atomic Force Microscopes (AFM) using innovative technology and automation software. We have established a global sales network in over 30 countries, and our Atomic Force Microscopes are used in various fields around the world. As a rapidly growing AFM company with world-class technological capabilities, we are committed to developing core technologies and excellent product development, leading the advancement of nanotechnology.
![[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls](https://image.mono.ipros.com/public/product/image/ba3/2000436245/IPROS14534065085904199956.jpg?w=280&h=280)
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