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  1. Home
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  3. Measurement and Analysis
  4. Microscopes
  5. Electron microscope
  6. Atomic Force Microscope "AFM with Stage"

Atomic Force Microscope "AFM with Stage"

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last updated:Aug 30, 2022

アローズエンジニアリング
アローズエンジニアリング
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The only microscope capable of non-destructive three-dimensional measurement down to the nanometer scale.

The atomic force microscope "AFM with stage" is the only microscope capable of non-destructive three-dimensional measurements down to the nanometer scale in the atmosphere. It allows measurements without damaging the sample. By using an electromagnetic scanner, stable long-term measurements can be achieved without worrying about non-linear creep or aging effects. With a large stage, it is possible to perform non-destructive measurements simply by setting the sample without cutting the workpiece. Various measurement modes are available, providing functions equivalent to expensive AFM devices. Regardless of the material of the measurement work, measurements at the nano level can be performed immediately, from conductors to insulators, without any coating. For more details, please download the catalog.

    Electron microscope
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Atomic Force Microscope "AFM with Stage"

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4.jpg
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【Features】 ○ Easy to move the device ○ Probe replacement is possible in just a few seconds using a quick-release mechanism, even for first-time users ○ Automatic measurement can be performed simply by inputting the desired coordinates or specifying from the MAP display ○ Two types of measurement heads are available: wide-range type and high-precision type ○ Measurement time for one scan is approximately one second ○ Side observation is possible in real-time ● For more details, please contact us or download the catalog.

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Applications/Examples of results

【Applications】 ○ Measurement of fine line widths ○ Surface analysis of high-precision molds ○ Measurement of mask patterns ○ Evaluation of optical components ○ Evaluation of polishing and lapping ○ Inspection of DVD pits and stampers ○ Measurement of step heights in thin films ○ Measurement of quantum dots ○ Continuous and discontinuous determination during film formation ○ Surface inspection of films ○ Observation of magnetic fields in hard disks ● For more details, please contact us or download the catalog.

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Product catalog for the atomic force microscope "AFM with stage"

Product catalog for the atomic force microscope "AFM with stage"

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アローズエンジニアリング

アローズエンジニアリング

Testing, Analysis and Measurement

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Since our company's establishment in 1986, we have long been engaged in semiconductor-related businesses that support Japan's cutting-edge technology. On the hardware side, we have developed construction and manufacturing environments, including clean rooms. On the human resources side, we have focused on training semiconductor engineers and establishing a service system that can promptly respond to customer needs. Last year, we participated in SEMICON Japan for the first time, and by directly interacting with many industry stakeholders, we were able to learn again what is currently needed and what services should be created. At the same time, the morale within the company has been rising, and we are actively conducting sales activities. It is said that the Japanese economy is finally showing signs of recovery. However, even just looking at the semiconductor industry, the entry of overseas manufacturers and the significant improvement in technology and services are remarkable, so we aim to enhance our international competitiveness in our sales expansion. Not only domestically but also in response to the era of globalization, our role as a hub connecting North America and Asia, especially given our excellent airport access, will further increase.

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