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  3. Measurement and Analysis
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  6. Atomic Force Microscope "Handy AFM"

Atomic Force Microscope "Handy AFM"

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last updated:Oct 21, 2026

アローズエンジニアリング
アローズエンジニアリング
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A super compact AFM with a depth and width that can take you anywhere, both measuring 15 cm.

The atomic force microscope "Handy AFM" can be used as a substitute for high-magnification optical microscopes. It features standard measurement modes, including static force mode, dynamic force mode, phase contrast, phase measurement, force modulation, spreading resistance, and external input capabilities. The scanning head is available in two types: high-resolution and wide-area, and they can be exchanged instantly. Probe replacement takes only a few seconds, and no adjustments are needed after replacement. Additionally, carbon nanotube probes can also be approached automatically. By using an electromagnetic scanner (patented) for scanning, there is no need to move the workpiece during the scan. Generally, it does not exhibit the non-linear creep or aging changes associated with piezo devices commonly used in AFMs. Optionally, it can be combined with a compact automatic stage. For more details, please download the catalog.

    Electron microscope
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Atomic Force Microscope "Handy AFM"

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  • Related Link - http://arrowseng.com/index.php?id=122
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【Features】 ○ Operable from a notebook PC ○ Two types of scanning heads are available: high resolution and wide area ○ Probes can be exchanged in just a few seconds ○ Carbon nanotube probes can also be auto-approached ○ Can be combined with a compact automatic stage (optional) ● For more details, please contact us or download the catalog.

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Applications/Examples of results

【Applications】 ○ Measurement of fine line widths ○ Surface analysis of high-precision molds ○ Measurement of mask patterns ○ Evaluation of optical components ○ Evaluation of polishing and lapping ○ Observation of magnetic fields in hard disks ○ Measurement of step heights in thin films ○ Inspection of DVD pits and stampers ○ Continuous and discontinuous determination during film formation ○ Measurement of quantum dots ○ Surface inspection of films ● For more details, please contact us or download the catalog.

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Product catalog for the atomic force microscope "Handy AFM"

Product catalog for the atomic force microscope "Handy AFM"

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アローズエンジニアリング

アローズエンジニアリング

Testing, Analysis and Measurement

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Since our company's establishment in 1986, we have long been engaged in semiconductor-related businesses that support Japan's cutting-edge technology. On the hardware side, we have developed construction and manufacturing environments, including clean rooms. On the human resources side, we have focused on training semiconductor engineers and establishing a service system that can promptly respond to customer needs. Last year, we participated in SEMICON Japan for the first time, and by directly interacting with many industry stakeholders, we were able to learn again what is currently needed and what services should be created. At the same time, the morale within the company has been rising, and we are actively conducting sales activities. It is said that the Japanese economy is finally showing signs of recovery. However, even just looking at the semiconductor industry, the entry of overseas manufacturers and the significant improvement in technology and services are remarkable, so we aim to enhance our international competitiveness in our sales expansion. Not only domestically but also in response to the era of globalization, our role as a hub connecting North America and Asia, especially given our excellent airport access, will further increase.

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