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  6. Non-contact measurement solution for film thickness measurement 'IRIX'

Non-contact measurement solution for film thickness measurement 'IRIX'

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IRIX

last updated:Feb 12, 2025

マーポス
マーポス
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A non-contact sensor using chromatic confocal technology measures the distance and thickness of various materials that transmit white light.

By combining a diverse family of optical probes and controllers with various measurement ranges, mechanical dimensions, and measurement specifications, we can meet a wide range of application needs. We offer two models: the single-channel "CPS1" and the dual-channel "CPS2." <Features> - Capable of measuring various materials that can reflect white light (e.g., metals, glass, plastics, coatings, liquids) - Non-contact measurement possible in all cases where contact with the subject is not required - Can measure up to five layers of transparent layers simultaneously with a single optical probe - High measurement accuracy - Replaceable sensors (up to 32 maps can be saved, suitable probes can be used) - 7-inch integrated display - Passive optical probe unaffected by thermal or electrical noise - Easily integrable into any system using SDK and protocol commands - Reduction of measurement spot - Dynamic collection possible through measurements synchronized with an encoder (spatial synchronization) - Capable of measuring roughness *For more details, please refer to the PDF document or feel free to contact us.

    Other measurement, recording and measuring instrumentsOptical Measuring Instruments
IRIX_01_s.jpg

Non-contact measurement solution for film thickness measurement 'IRIX'

IRIX_01_s.jpg
IRIX_01_s.jpg
  • Related Link - https://www.marposs.com/jpn/product/chromatic-conf…
  • Special site - Product/service details - https://pr.mono.ipros.com/marposs/product/

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【Catalog Contents (Excerpt)】 <Optical Pen> ■Measurement Range ■Operating Distance ■Maximum Object Inclination ■Axial Model ■Radial Model ▼Currently on display at the Marposs EV Virtual Showroom! We invite you to visit!▼ https://www.marposs.com/vs/ev/jpn/index.htm *For more details, please refer to the PDF document or feel free to contact us.

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Chromatic Confocal Technology Non-Contact Measurement Solution 'IRIX'

Chromatic Confocal Technology Non-Contact Measurement Solution 'IRIX'

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Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

Chromatic confocal technology, non-contact measurement solution for thickness measurement 'STIL'

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News about this product(11)

EV, HV, and FCV Technology Exhibition

Notice of Participation in the EV, HV, and FCV Technology Exhibition (Automotive World)

  • Seminar・Event

Our company will be exhibiting at the "EV, HV, and FCV Technology Exhibition (EV JAPAN)" held at Tokyo Big Sight starting January 24, 2024 (Booth Number: E70-42). At this exhibition, we will showcase the latest measurement and inspection technologies for EV production, focusing on our newest product, the "Ultrasonic Weight Measurement System for Electrode Materials." We invite you to visit our booth and take a look at our offerings. Exhibited Products: - Ultrasonic Weight Measurement System for Electrode Materials - Non-contact Measurement Device for Distance/Thickness for Electrode Materials - Press Processing Monitoring System - Electric Motor Function Testing System - Various Leak Testing Systems for Secondary Batteries, Next-Generation Batteries, and Fuel Cells Please register for an entry badge using the URL below, print it in color in advance, and bring it to the venue. https://www.nepconjapan.jp/tokyo/ja-jp/register.html?code=0928277343869496-JEL * Entry is by "pre-registration only."

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SEMICON JAPAN 2023

Notice of Participation in SEMICON JAPAN 2023

  • Seminar・Event

Our company will be exhibiting at "SEMICON JAPAN 2022," which will be held at Tokyo Big Sight starting December 13, 2023 (Booth Number: 2105). At this exhibition, we will introduce semiconductor industry-specific applications and non-contact measuring instruments that contribute to the reliability of the ever-evolving semiconductor manufacturing processes and the improvement of semiconductor performance. We sincerely look forward to seeing you at our booth. Exhibited Products: - Non-contact thickness measurement gauge (Interferometry technology) - Non-contact distance/thickness/film thickness measuring instrument (Chromatic confocal technology) - Contact/non-contact hybrid applications

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Secondary Battery Exhibition

Notice of Participation in the Secondary Battery Exhibition (Battery Japan)

  • Seminar・Event

Our company will be exhibiting at the "Secondary Battery Expo (Battery Japan)" held at Tokyo Big Sight starting from March 15, 2023 (Wednesday). (Booth number: 35-40) At this exhibition, we will showcase various inspection and precision measurement equipment related to the improvement of reliability and performance in the secondary battery manufacturing process. Please be sure to visit our booth. Exhibited products: - For secondary batteries (LIB, all-solid-state batteries, next-generation batteries) - Thickness measurement system for electrodes - Monitoring system for case manufacturing processes - Expansion rate measurement bench - Various leak test systems for secondary batteries / next-generation batteries / fuel cells - Helium leak test system for fuel cell separators/BPP, among others ◆◇ e-invitation ticket ◆◇ https://www.wsew.jp/spring/ja-jp/visit/e-ticket-ex/bj.html?BJS1-0674_ml *One ticket is required per person. Please print out the number of tickets needed or show the screen.

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SEMICON JAPAN 2022

Notice of Participation in SEMICON JAPAN 2022

  • Seminar・Event

Our company will be exhibiting at "SEMICON JAPAN 2022," which will be held at Tokyo Big Sight from December 14, 2022 (Wednesday). (Booth number: 1517) At this exhibition, we will mainly showcase semiconductor industry-specific applications and non-contact measuring instruments related to the improvement of reliability and performance in semiconductor manufacturing processes. We sincerely look forward to seeing you at our booth. Exhibited products: - Non-contact thickness measurement gauge (interferometry technology) - Non-contact distance/thickness measuring instrument (chromatic confocal technology) - Contact/non-contact hybrid applications (new products, world premiere) - Grinding wheel measurement applications (non-contact camera imaging visual tool setter) - Process monitoring system

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マーポス

マーポス

Testing, Analysis and Measurement

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Marpos Co., Ltd. was established in 1970 as the Japanese subsidiary of the Italian Marpos Group, aiming to be a partner in global manufacturing. For over 50 years, we have been providing precision measurement, inspection, and process management systems used during and after machining in manufacturing processes. We are a main supplier to major automotive manufacturers for both ICE (internal combustion engine) and EV (electric vehicle) and also extend our services to the semiconductor, aerospace, medical, energy, and home appliance industries. Regardless of the size or industry of our customers, we continue to boldly contribute to quality improvement, rationalization, flexibility, and productivity enhancement with Marpos's technology and know-how. Furthermore, in line with Marpos's corporate philosophy, we strive for total quality improvement, have obtained ISO 9001:2015 certification, and conduct design, manufacturing, and assembly in Japan. We have six domestic locations and two overseas locations, providing closely connected services to local customers.

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