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  6. [Data] Example of EPMA Analysis

[Data] Example of EPMA Analysis

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last updated:Jun 26, 2025

アイテス
アイテス
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By using LIF and LIFH spectroscopic crystals, peak separation of 22Ti and 56Ba becomes possible!

EPMA has superior detection resolution compared to EDX. Even in cases where the detection positions of elements are close in EDX, making peak separation difficult, it may be possible to achieve peak separation with EPMA. This document introduces the peak separation of 22Ti and 56Ba. It includes analysis examples of multilayer ceramic capacitors and X-ray spectra of barium titanate (BaTiO3). [Contents] - Peak separation of 22Ti and 56Ba - Analysis example: Multilayer ceramic capacitors - X-ray spectrum of barium titanate (BaTiO3) *For more details, please refer to the PDF document or feel free to contact us.

    Contract Analysis
EPMA分析例.png

[Data] Example of EPMA Analysis

EPMA分析例.png
EPMA分析例.png
  • Related Link - https://www.ites.co.jp/analyze/index.html
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Total support service for cross-section grinding, processing, observation, and analysis.

Total support service for cross-section grinding, processing, observation, and analysis.

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State analysis by EPMA

State analysis by EPMA

TECHNICAL
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Detection of trace elements by EPMA

Detection of trace elements by EPMA

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Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.

Detection sensitivity due to differences in acceleration voltage during SEM-EDX analysis.

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Seven spectral crystals in EPMA analysis

Seven spectral crystals in EPMA analysis

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Changes due to differences in acceleration voltage during EDX analysis.

Changes due to differences in acceleration voltage during EDX analysis.

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[Data] Example of EPMA Analysis

[Data] Example of EPMA Analysis

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EPMA analysis

EPMA analysis

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[Data] EPMA Analysis Example 2

[Data] EPMA Analysis Example 2

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Example of EPMA analysis using the guide network map method.

Example of EPMA analysis using the guide network map method.

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アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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