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  6. Probe needle, probe holder, and manipulator.

Probe needle, probe holder, and manipulator.

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last updated:May 01, 2024

シスコム(SysCom)
シスコム(SysCom)
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Products from Micromanipulator, a U.S. company that has been developing and manufacturing probing-related products for semiconductor device analysis for over 60 years.

Probe Needle: Various probe needles are available for high-temperature probing and other probing purposes, tailored for ultra-small targets with a tip radius of 0.1μm. They can be used as replacement probe needles for existing probing systems. Probe Holder: The probe needle is set at the tip and combined with a manipulator. Products are available with Kelvin connections, coaxial and triaxial specifications, as well as those that incorporate both functions (e.g., triaxial specification with Kelvin connection). Manipulator: The probe holder, equipped with a probe needle at the tip, is attached to perform probing on the target. Two types are available: magnetic and vacuum suction base.

    WaferTransistorDedicated IC
7A

Probe needle, probe holder, and manipulator.

7A EDITED.jpg
7A EDITED.jpg Probe Tip Dimesions - コピー (2).jpg 7B - コピー.png 7S - コピー.png 7X- コピー.png 79-6000-TD-03.jpg 79-8000-TD-03.jpg 525 and 2525 Manipulator - コピー.png
  • Related Link - https://syscom-corp.jp/products/micromanipulator/
  • Special site - Product/service details - https://pr.mono.ipros.com/syscom/product/

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basic information

Model 7 Series Probe Needles: Tip Material: Tungsten, Shank Diameter: .020 inches Examples of Model 7 Series: Model 7A: For fine probing. Point Radius: 0.35μm, Tip Diameter: .005 inches Model 7S: Most flexible, ideal for high-temperature probing. Point Radius: 0.35μm, Tip Diameter: .005 inches Model 7X: For extremely small targets. Point Radius: 0.1μm, Tip Diameter: .003 inches Model 7B: High durability, for general probing (integrated to the tip). Point Radius: 0.5μm, Tip Diameter: .020 inches Probe Holder: Model 79-8000-TD-03 Kelvin Triaxial Probe Holder: Kelvin connection with triaxial specifications. The coaxial cable is connected at the tip of the holder. Coaxial specifications are also available.

Price range

P2

Delivery Time

P4

Applications/Examples of results

- Probing for semiconductor device analysis, Failure Analysis - Evaluation of device temperature characteristics - Evaluation of device reliability - Supports high frequency up to 500MHz - Life sciences - Probing inspection on silicon wafers

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シスコム(SysCom)

シスコム(SysCom)

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We will contribute to research and development in various fields by introducing analysis and evaluation equipment and sensor systems based on cutting-edge technology from Europe and the United States to the domestic market. Additionally, we will provide flexible and reliable technical support to meet our customers' diverse needs. Please feel free to consult us, even about minor matters.

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