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  6. ESD (HBM・MM) Testing Contract Service

ESD (HBM・MM) Testing Contract Service

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last updated:Jun 26, 2025

アイテス
アイテス
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From DUT board production to testing! We propose and conduct tests according to your requests and objectives.

The "ESD (HBM・MM) Testing Service" evaluates the resistance to damage caused by ESD using the Human Body Model and Machine Model, which are important for the reliability of semiconductor products and electronic components that include them. We accommodate products such as IC modules, semiconductor products, and subsystems with up to 512 pins. We conduct tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC. Additionally, if there are issues with resistance, we assist in problem-solving, including failure analysis and root cause investigation. 【Features】 ■ Supports products such as IC modules, semiconductor products, and subsystems with up to 512 pins ■ Partial support for products with more than 512 pins (consultation required) ■ Conducts tests in accordance with major domestic and international standards such as ESDA/JEDEC, JEITA, AEC, and IEC ■ Proposes and conducts tests tailored to customer requests and objectives ■ Assists in problem-solving, including failure analysis and root cause investigation, if there are issues with resistance *For more details, please refer to the PDF document or feel free to contact us.

    Contract measurement
R0003

ESD (HBM・MM) Testing Contract Service

R0003 ESD(HBM・MM)試験_2021-1210_写真1.jpg
R0003 ESD(HBM・MM)試験_2021-1210_写真1.jpg
  • Related Link - https://www.ites.co.jp/guarantee/index/%e8%a3%bd%e…
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【Device Overview/Evaluation Content】 ■ HBM Test (C=100pF, R=1.5kΩ) ±5V to ±4000V (Step: 5V) ■ MM Test (C=200pF, R=0Ω) ±5V to ±2000V (Step: 5V) ■ Supports various application conditions such as single/step-up application and pin combination application ■ Destruction judgment methods: Supports four types of evaluations: protection diode characteristic evaluation, IiL/IiH characteristic evaluation, VoL/VoH characteristic evaluation, and power pin characteristic evaluation ■ Handles everything from arranging sockets and dedicated conversion boards to manufacturing DUT boards for testing and conducting tests *For more details, please refer to the PDF document or feel free to contact us.

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Total solutions for the reliability of semiconductor products.

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Aites Device List

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Introduction to Reliability Assurance Services

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ESD (HBM・MM) Test Contract Service

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Specification verification and failure analysis through reliability testing.

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Company information

アイテス

アイテス

Electronic Components and Semiconductors

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

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