Reduce metal artifacts in CT images with AI technology to improve image analysis accuracy!
X-ray CT measurements allow for the non-destructive observation of the three-dimensional structure of samples. However, due to the nature of using X-ray beams, measurements of samples containing a large amount of metal may produce dark line-like artifacts known as metal artifacts, which can hinder the measurement of internal structures and image analysis. This document presents a case study on optimizing CT image reconstruction based on material information and physical models of the sample. This technology can reduce artifacts, enabling clearer evaluation of internal structures. Measurement method: X-ray CT, computational science, and data analysis Product fields: Electronic components, manufacturing equipment and parts, LSI and memory, daily goods Analysis objectives: Shape evaluation, structural evaluation 【Features】 ■ Clear observation of structures obscured by metal artifacts ■ Useful for CT observation of both resin and metal For more details, please download the document or contact us.
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