Data DL available: FIB Collection of case studies in FIB (Focused Ion Beam) processing
We will introduce many examples of our strengths using FIB, such as methods for detecting anomalies within plating layers, pattern drawing, and structural analysis.
Our company considers processing with FIB (Focused Ion Beam processing equipment) to be one of our strengths. In this case study collection, we will introduce examples related to FIB. We have included numerous items such as the following objectives, methods, and results: - Method for discovering abnormal areas within plating layers using FIB - Pattern drawing using FIB - Cross-section fabrication of micro-sized objects using FIB Additionally, we present measurement data, analysis cases, and features. We invite you to read it. [Contents] ■ Method for discovering abnormal areas within plating layers using FIB ■ Pattern drawing using FIB ■ Cross-section fabrication of micro-sized objects using FIB ■ Nano-level high-precision processing ■ Structural analysis through AFM surface measurement and FIB cross-section observation *For more details, please refer to the PDF document or feel free to contact us.
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【Details of Publication (Excerpt)】 ■Method for Detecting Abnormalities in Plating Layers Using FIB ・Objective: To discover abnormalities within the plating layer that cannot be identified from the surface ・Method: Utilizing the continuous automatic cross-sectioning feature of the FIB device ■Pattern Drawing Using FIB ・Objective: Introduction of maskless pattern drawing using the FIB device ・Method: FIB device *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
![Focused Ion Beam Processing Observation Device [Examples of Processing Available]](https://image.mono.ipros.com/public/product/image/09c/2000214591/IPROS16322970885782301496.jpeg?w=280&h=280)
![[Analysis Case] Measurement of Impurity Concentration on the Surface and Inside of SiC Substrates](https://image.mono.ipros.com/public/product/image/b28/2000999624/IPROS35315001111634549606.jpeg?w=280&h=280)
