We have carefully selected case studies using XPS, AES, and AFM for discoloration investigation and surface modification evaluation. Please take a look and download the materials.
In this case study collection, we will introduce examples related to "surface analysis." We feature numerous characteristics and analysis cases, including "investigation of discoloration on material surfaces using XPS," "evaluation of surface modification of PET using XPS," "analysis of hydrophobic films using XPS," and "evaluation of heating effects on plated parts." Additionally, we present analysis results, discoloration investigations, surface modification evaluations, and analyses of hydrophobic films. We encourage you to read through it. [Contents] ■ Investigation of discoloration on material surfaces using XPS ■ Evaluation of surface modification of PET using XPS ■ Analysis of hydrophobic films using XPS ■ Evaluation of heating effects on plated parts (AFM, AES) *For more details, please refer to the PDF document or feel free to contact us.
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【Details of Publication (Excerpt)】 ■Investigation of Surface Discoloration of Materials using XPS <Features> - Since elemental information from the very surface of the sample (a few nm) can be obtained, it is effective for evaluating surface treatments and analyzing surface contamination and discoloration. - Not only can elements be identified, but the bonding states of the elements can also be analyzed. - Analysis examples ■Evaluation of PET Surface Modification using XPS <Features> - Elemental information from the very surface of the sample (a few nm) can be obtained (depth analysis is also possible with the use of Ar ion sputtering). - Information on the bonding states of the constituent elements can be obtained. *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
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