X-ray photoelectron spectroscopy (XPS) can obtain elemental information from the very surface of the sample (a few nm), making it useful for evaluating surface contamination and surface treatment.
We obtained XPS narrow spectra and analyzed the states of the C1s spectra, which allowed us to determine the types of carbon bonds and their quantitative values. By combining this with contact angle measurements, it can be utilized for evaluating hydrophobicity and hydrophilicity. In this case, we will introduce "Analysis of Hydrophobic Films by XPS." Please take a moment to read the PDF materials. Additionally, our company conducts various surface analyses, including GD-OES and Auger, in addition to XPS. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.
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●Since it is possible to obtain elemental information from the very surface of the sample (a few nm), it is effective for analyzing surface contamination and discoloration, as well as for evaluating surface treatments. ●Not only can elements be identified, but the analysis of the bonding states of the elements is also possible. *For more details, please refer to the PDF materials or feel free to contact us.*
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For more details, please refer to the PDF document or feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.