We will select appropriate conditions such as measurement atmosphere based on the information the customer wants to know and conduct the measurement using TG-DTA.
The differential thermal gravimetric analysis device (TG/DTA) allows for the measurement of weight changes due to oxidation, thermal decomposition, dehydration, etc., as well as the evaluation of thermal resistance and analysis of reaction rates. In this case, we will introduce "the influence of atmosphere in TG-DTA measurements." We listen to our customers' situations and propose appropriate measurement atmospheres, which serves as the background for this. By utilizing this comparison, it is possible to distinguish whether the resin sample itself is burning or if it is gas released from the sample. In addition to TG/DTA, our company also specializes in various thermal analyses such as DSC and TMA. ●DSC: It can be used for the analysis of sample melting, glass transition, thermal history, crystallization, curing, Curie point, etc., as well as for measuring specific heat. ●TMA: It can be used for measuring sample expansion rates, glass transition, softening points, etc. Please see the following for examples of thermal analysis: https://www.seiko-sfc.co.jp/case/index.html *Other materials are also available. If you request them through the inquiry button, we will send them to you.
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basic information
●Objective: To confirm how the differences in atmosphere affect the measurement data. ●Method: TG DTA measurements in air and nitrogen atmospheres. In this measurement, differences were observed in the DTA peaks due to the differences in atmosphere. For more details, please contact us or download the catalog.
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Company information
Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.