X-ray photoelectron spectroscopy (XPS) is effective for analyzing surface contamination and discoloration, as well as evaluating surface treatments. In addition to identifying elements, it also allows for the analysis of the bonding states of those elements.
X-ray photoelectron spectroscopy (XPS) can obtain elemental information from the very surface of a sample (a few nm), making it effective for evaluating surface treatments and analyzing surface contamination and discoloration. It is capable not only of identifying elements but also of analyzing the bonding states of those elements. In this case, we will introduce the "investigation of discoloration on a material surface (nickel plating) using XPS." We explored the reasons for discoloration, which is a defect in nickel plating, through surface analysis with XPS. Please take a moment to read the PDF materials. Additionally, our company conducts various surface analyses, including GD-OES and Auger spectroscopy, in addition to XPS. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request them through the inquiry button, we will send them to you.
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basic information
By conducting a combined state analysis on the products of the two companies, it was found that surface oxidation affects the color tone of the plating appearance.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
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