[DL available/GD-OES measurement] Investigation of the composition of discolored stainless steel
Using GD-OES (Glow Discharge Optical Emission Spectroscopy), it is possible to sputter the surface of stainless steel (SUS) and obtain compositional information in the depth direction.
Glow Discharge Optical Emission Spectrometry (GD-OES) is a method for analyzing the composition of a sample by sputtering atoms from the surface of the sample, exciting those atoms into a plasma state, and measuring the resulting emission. One of the features of this device is its ability to detect hydrogen (H). In this case, we will introduce the "composition investigation of discolored stainless steel (SUS)." Please take a moment to read the PDF materials. Additionally, our company conducts various surface analyses, including XPS and AES Auger, in addition to GD-OES. We would be happy to assist you, so please feel free to reach out. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *Other materials are also available. If you request through the inquiry button, we will send them to you.
Inquire About This Product
basic information
● It is possible to investigate the compositional information in the depth direction by sputtering the sample surface. ● Measurements can be made with high depth resolution on the order of nm.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（1）
Download All Catalogs![[GD-OES Measurement] Composition Investigation of Discolored Stainless Steel](https://image.mono.ipros.com/public/catalog/image/01/f0f/675308/IPROS36013902203871086402.jpeg?w=120&h=170)
Company information
Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
![<PDF Data Download Available> [XPS] Contamination Analysis of Polyimide Surfaces Using XPS](https://image.mono.ipros.com/public/product/image/46c/2000738061/IPROS48050819658542478910.png?w=280&h=280)
![[Analysis Case] Component Analysis of Additives in Rubber Products](https://image.mono.ipros.com/public/product/image/c2b/2001512432/IPROS10397238807307473945.jpg?w=280&h=280)
