Remote attendance analysis is now possible online! Of course, we also accept in-person attendance.
We will conduct the on-site analysis usually performed during regular visits online using web conferencing tools. - We will share data images from the analysis equipment on the web conferencing tool. - We will provide explanations of the analysis content from our company, exchange information between our company and the customer, and conduct Q&A in real-time via communication. - This can be done using FIB, TEM, and AFM. Please consult us about other analysis equipment as well. We would be happy to discuss on-site analysis with you. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/ *We have many analysis case studies available. If you request through the inquiry button, we will send them to you.
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basic information
We mainly use Microsoft Teams for web conferencing tools, but we can accommodate customer requests with Cisco Webex Meetings, Zoom, V-CUBE, and others.
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Applications/Examples of results
Please feel free to contact us for achievements and case studies.
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Company information
Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.