Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
24 million pixel high-definition camera Auto focus Automatic power control Supports bulk measurement of large modules Easy yet high-performance image processing software Achieves a low price of one-third of conventional models Free sample evaluation demo now available.
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basic information
The "PVX series" device for detecting potential defects in solar cells has been enhanced with the addition of the high-performance, low-cost model PVX330. While emphasizing the basic functions as an EL image measurement device, it is equipped with a high-resolution 24-megapixel camera in the optical system and features the industry's first autofocus function, allowing for easy operation and the acquisition of clear EL images. This can be utilized for identifying micro-cracks and defective electrode areas, as well as sorting out defective cells in modules. In thin-film solar cells, it is capable of detecting and locating film formation defects and issues with scribed electrodes.
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Applications/Examples of results
Proven track record with compound solar cells such as single crystal, polycrystalline, thin-film silicon, and CIGS. Usage examples: - Sampling inspection in mass production processes - Incorporated as a detection unit in inline inspection processes - Identifying defect locations prior to failure analysis in the development department - Measurements before and after environmental testing in reliability evaluation
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Company information
Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.
