Achieved a guaranteed resolution of 1.6 nm at a low acceleration voltage of 1 kV.
The Japan Electronics Corporation JIB-4700F composite beam processing observation device meets the high resolution and precision needs for evaluation techniques such as morphological observation, elemental analysis, and crystallographic analysis. Combined with the "in-lens Schottky electron gun," it enables high-resolution observation and high-speed analysis. 〇 Features - High-resolution SEM observation - High-speed analysis - High-speed processing - Enhanced detection system - Three-dimensional observation and analysis *For more details, please download the PDF or feel free to contact us.
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【Specifications】 〇SEM Acceleration Voltage: 0.1 to 30.0 kV Resolution (at optimal WD): 1.2 nm (15 kV, GB mode) 1.6 nm (1 kV, GB mode) Magnification: x20 to 1,000,000 (LDF mode equipped) 〇FIB Acceleration Voltage: 1 to 30 kV Image Resolution: 4.0 nm (30 kV) Magnification: x50 to 1,000,000 (x50 to 90 is possible at acceleration voltage below 15 kV) *For more details, please refer to the PDF or feel free to contact us.
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P9
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Applications/Examples of results
【Purpose】 Three-dimensional observation of fine areas of metallic materials, three-dimensional observation of elements and crystals, etc.
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Company information
Since its establishment in 1974, Azusa Science Co., Ltd. has contributed to the local community as a specialized trading company with strengths in both the scientific and medical fields, supporting the advancement of life-pursuing science. We offer a wide range of products in various fields, including physical and chemical instruments, medical devices, testing equipment, analytical instruments, in vitro diagnostic reagents, pharmaceuticals, reagents, and consumables, responding to the increasingly sophisticated and diverse needs of our customers. Furthermore, we are actively advancing software development utilizing our network, working on systematization for our customers and revitalizing communication with them.
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