Effective for long-duration and large-volume vacuum deposition or sputtering processes.
This is a multipoint sensor connected to the crystal oscillator type film thickness controller/monitor of Nippon Electronics Corporation, used to measure/control film thickness and deposition rate during vacuum deposition. You can select and combine the length of the vacuum chamber, sensor head type, and the number of crystal oscillators (crystals). 〇 Features - Detection holes are in fixed positions - Can accommodate 6 or 12 crystal oscillators *For more details, please download the PDF or feel free to contact us.
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basic information
Please take a look at the PDF or feel free to contact us.
Price information
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Price range
P5
Delivery Time
※Delivery areas may vary, so please feel free to contact us.
Applications/Examples of results
[Purpose] Measuring/controlling film thickness and deposition rate during vacuum deposition.
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Company information
Since its establishment in 1974, Azusa Science Co., Ltd. has contributed to the local community as a specialized trading company with strengths in both the scientific and medical fields, supporting the advancement of life-pursuing science. We offer a wide range of products in various fields, including physical and chemical instruments, medical devices, testing equipment, analytical instruments, in vitro diagnostic reagents, pharmaceuticals, reagents, and consumables, responding to the increasingly sophisticated and diverse needs of our customers. Furthermore, we are actively advancing software development utilizing our network, working on systematization for our customers and revitalizing communication with them.
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