Full testing at low cost! The sealed structure of the probe ensures the safety and reliability of the press.
Our "KGD" is a testing device that performs 4Site parallel testing, capable of conducting static and dynamic tests at both room temperature and high temperature. The UPH is high, ranging from 1000 to 1200, with high testing efficiency, significantly reducing testing costs. It also supports various LD/ULD boxes. The sealed structure of the probe ensures the safety and reliability of the inspection. 【Features】 ■ Compatible with various LD/ULD boxes ■ Temperature range RT-200°C (optional -45°C) ■ Supports 3000V/1200A ■ Capable of full testing with 4Site parallel testing and static + dynamic tests ■ Specially designed circuits guarantee circuit inductance of less than 15nH *For more details, please refer to the PDF document or feel free to contact us.
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We are a global supplier of advanced testing and measurement equipment. We provide high-performance and highly integrated measurement solutions that can support everything from research and development to mass production processes in cutting-edge fields such as high-speed communication, optical chips, electronic measurement, and power semiconductors. Since our founding, we have placed "Dedication and Craftsmanship" at the core of our corporate values, pursuing product development that combines deep insights into measurement principles with a spirit of craftsmanship. Aiming to be "the best testing solution company supporting global technological innovation," we will continue to provide high-performance, high-efficiency, and highly reliable solutions to address global industrial challenges.