Quantitative evaluation of the guest in the light-emitting layer and film thickness is possible.
Organic EL displays are advancing towards practical use by leveraging advantages such as high brightness, high-resolution color, and thinness due to their self-emission principle. In the emission layer, guest molecules are doped into host molecules to enhance the emission efficiency. In this study, we identified the emission layer materials for red pixels in organic EL display elements. Additionally, we conducted thickness evaluation of the emission layer using a newly developed step gauge and quantified the guest materials within the emission layer. This allows for qualitative and quantitative analysis of guest molecules in the emission layer, as well as evaluation of the thickness of the emission layer. Measurement methods: TOF-SIMS, TEM, XPS Product field: Displays Analysis purpose: Composition evaluation, identification, thickness evaluation For more details, please download the materials or contact us.
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This is an analysis of the display.
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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!
